Micro Focus Soft X-ray Inspection Device 'SHR COMPACT'
Stage size of 360×280mm! Achieved advanced X-ray inspection with ultra-high-resolution X-ray images.
The "SHR COMPACT" is a non-destructive testing device equipped with micro-focus technology, capable of internal visualization of various industrial products. It primarily has the ability to clearly depict the internal conditions of ICs, substrates with BGA and CSP implementations, defect inspections of electronic devices, as well as foreign objects, voids, and cracks in plastic products, and foreign objects, voids, and cracks in die-cast products in real-time. Additionally, it is completely shielded, so no qualifications are required, allowing anyone to handle it with confidence. 【Features】 ■ Sealed micro-focus technology ■ High-speed flat panel detector ■ Smooth operability achieved through PC control ■ Flexible installation locations ■ High cost performance *For more details, please download the PDF or feel free to contact us.
- Company：SOFTEX CO., LTD. SALES DEPT.
- Price：Other
![[Equipment Introduction] Y.CT COMPACT <Computed Tomography>](https://image.mono.ipros.com/public/product/image/83c/2000884360/IPROS55609728165076769041.png?w=280&h=280)
